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Woman using a Tektronix IsoVu Isolated Current Shunt Probe and 4 Series B MSO oscilloscope to measure dynamic draw on a processor board during I/O activity.
新型IsoVu™ 隔离电流探头:为电流测量带来全新维度 Wednesday, November 27, 2024
示波器测量电流的常见方法包括使用电流互感器、罗氏线圈和霍尔效应钳式探头。按规格要求使用时,优质磁探头的测量结果非常准确。因为不需要破坏原有电路,因此用于测量在电线或测试回路中流动的电流也很方便。然而,磁探头存在一些固有的局限性。在本文中,作者将介绍针对基于分流器进行电流测量而优化的探头属性,并探讨 IsoVuTM隔离电流探头特别适用的两种应用。 如上所述,使用磁探头测量时需要一根线圈。由于物理限制或电路的敏感性,有时无法使用这种线圈。由于磁性材料的特性,即使是高端钳式电流探头,带宽也被限制在 100 MHz 左右。尽管人们可能会认为非接触式探头不会影响电路性能,但磁探头插入阻抗的意外影响却让许多工程师困惑不已,因为该阻抗在全带宽下可能接近 1 Ω。   图 1当有电线或测试环路可用、插入电感可以容忍且带宽限制在 100 MHz 左右时,使用示波器钳式交流/直流电流探头非常方便 …
Female engineer using a Tektronix oscilloscope, shown with attached probes and device under test (DUT)
Scope ADC Resolution is Nothing Without Good Probes Thursday, September 19, 2024
Key Factors Determining the Accuracy of Electrical Signal Measurement Measurement accuracy is often misunderstood as being solely dependent on the specifications of the instrument, such as the number of waveforms displayed on its screen. However, true accuracy is much more complex. It is closely tied to how well the measurement setup preserves the integrity of the signal being measured. The …
Low frequency response curves with AC coupling or DC reject turned on, for different types of probes
Probe Points: Understanding Low Frequency Response Friday, June 28, 2024
The Practice of AC Coupling and DC Reject Modes The practice of AC coupling the scope input or using a probe with DC reject capability is very common when looking at noise and/or ripple of DC power rails. Anytime there is insufficient DC offset available, then users often elect to use AC Coupling or DC Reject settings. With the focus on clean power, we see users more interested than ever before in …
Tektronix’ Wide Bandgap Double Pulse Test Solution including the Wide Bandgap Double Pulse Test application (Opt. WBG-DPT) which runs on the 5 Series B MSO oscilloscope
The Importance of Double Pulse Testing for Designing Today’s Power Converters Thursday, June 27, 2024
​The field of power electronics is rapidly transitioning from the use of silicon semiconductor materials to wide bandgap semiconductors such as silicon carbide (SiC) and gallium nitride (GaN). One of the most common applications of GaN and SiC semiconductors is to enable smaller, faster and more efficient designs of power converters. Power converters operate at multiple stages throughout the power …
Tektronix power rail measurement with Passive Probes (below) and Power Rail Probes (above)
Achieving Better Energy Efficiency in AI Data Centers With Power Integrity Testing Tuesday, June 18, 2024
Introduction Deployment of AI-based technology is happening in the Data Center. The processor-intensive servers are driving up energy demands. The table below illustrates the magnitude of the impact. The International Energy Agency (IEA) predicts that data centers will account for up to seven percent of global electricity consumption by 2030; a number equivalent to the entire country of India’s …
Double pulse test with AFG31000
4 Key Testing Phases for Power Conversion Equipment Tuesday, February 14, 2023
While the types of electrical tests required during the design and production of power conversion equipment are similar to those required for previous generations of devices, the adoption of wide-bandgap materials like silicon carbide (SiC) or gallium nitride (GaN) requires added rigor and new test strategies. Bench testing continues to play an important role at every stage of the development of …
Tektronix at DesignCon 2023
Gain Powerful Design Insights, Join Tektronix at DesignCon 2023 Wednesday, January 18, 2023
DesignCon 2023 is happening January 31 – February 2, 2023 at the Santa Clara Convention Center in Santa Clara, CA and we’ll be at Booth 727. Swing by and we’ll show you – in real time – practical applications to solve current and emerging test challenges.  Here’s what you’ll find… Deep Dive Into DDR5 and LPDDR5/5X Explore the Tektronix memory solutions (leveraging powerful analysis tools) on AMD’s …
Engineer using a Tektronix Isolated probe with an oscilloscope
SiC MOSFETs Represent Opportunities and Measurement Challenges for EV Designers Tuesday, November 15, 2022
Innovation in semiconductor technology is enabling more efficient and dense power conversion in hybrid and electric vehicles. Wide bandgap silicon carbide (SiC) technology enables faster switching and lower switching loss in high voltage EV systems.  However, the same fast switching and high voltage capabilities that make SiC MOSFETs so promising, also create measurement challenges. Probing the …
DRAM Memory
New Ways to Access Ever-Smaller DRAM Memory Friday, April 1, 2022
We’re in a new age of data. As our world becomes more enabled and new technologies are implemented, the world is experiencing an explosion in the amount of data being generated and processed. According to Statista global research, there will be 97 Zettabytes of data created this year. Even more jarring is the acceleration of the pace at which that data is being created; a 2020 study delivered by …
5 series mixed signal oscilloscope with a Tektronix IsoVu probe
Best Practices When Handling Tektronix IsoVu Isolated Differential Probes Monday, December 20, 2021
In this article, we will explore in detail some best practices to follow when handling Tektronix's isolated differential probe, also known as IsoVu™ probes. What is IsoVu?  IsoVu is the brand name used to describe Tektronix's isolated differential probes. Generation One (TIVHx/TIVMx) was released several years ago, and Generation Two (TIVPx) came out more recently. IsoVu probes were originally …