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产品技术资料 文献编号： 发布日期 2651A 大功率系统数字源表 (SourceMeter® )
大功率2651A 型数字源表进一步丰富了2600A 系列产品。该源表专门针对大功率电子器件的特性分析和测试而优化设计，可帮助用户在研发、可靠性及生产领域提高生产力，包括高亮度LED、功率半导体、DC/DC 转换器、电池，以及其他大功率材料、元件、模块和组件的特性分析和测试。1KC-61474-0 2657A 高功率数字源表
2657A是一种高电压、高功率、低电流源测量单元（SMU），具有迄今为止最高的功率、 精度、速度、灵活性和易用性，能够大大提高研发、生产测试和可靠性环境的测试效 率。1KC-61475-0 KickStart 仪器控制软件
KickStart软件让你加快获得测量数据。 KickStart简化了您需要知道的仪器知 识，在短短几分钟内，您就可以开箱使 用仪器，获得被测器件的实际数据。通 过立即绘制数据图，在读表中快速提供 数据的统计汇总，KickStart可以让您 更快地收集所需信息，制订所需决策， 转向器件开发的下一个阶段。通过使用 方便的导出功能，KickStart可以简便 迅速地复现测试，比较结果，节省时间。 有了KickStart，您可以把重点放在理 解测试结果上，让您的团队满足创新目 标。1KW-60965-3 TSP Toolkit Visual Studio Code Extension
The Keithley TSP Toolkit is a Visual Studio Code extension that provides rich support for Keithley’s TSP technology to edit and execute scripts. The datasheet provides information about its features and functionality.1KW-74115-0 Model CA-558 3-Pin Interlock Connector Cable Information
The Model CA-558 is a 25-pin male D-sub to 3-pin female interlock cable assembly.PA-1044B Model 2657A-PM-200 External Protection Module
The Model 2657A-PM-200 Protection Module (PM) is a stand-alone module that protects certain lower-voltage source-measure units (SMUs) that are part of a testing configuration from damage by voltage sources that are greater than 220 V.PA-1055B
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手册 手册类型 部件号： 发布日期 TSP Toolkit Quick Start Guide
用户 077187800 Model 2657A High Power System SourceMeter Instrument Quick Start Guide
用户 2657A-903-01C Keithley Instruments Software and Documentation Downloads
Document that provides descriptions of some of the software, drivers, and documentation that is available on the website.用户 071352702 Model 2651A High Power System SourceMeter Instrument Quick Start Guide
The Model 2651A High Power System SourceMeter Instrument Quick Start Guide provides unpacking instructions, describes basic connections, reviews basic operation information, and provides a quick test procedure to ensure the instrument is operational.主要用户 2651A-903-01C Keithley Instruments Safety Precautions
Safety Precautions PA用户 071341102 Model CA-558 3-Pin Interlock Connector Cable
Model CA-558 3-Pin Interlock Connector Cable User Manual用户 PA-1044B Model 2657A-PM-200 Protection Module User's Guide
Model 2657A-PM-200 Protection Module User's Guide User Manual主要用户 PA-1055B Model 2657A High Power System SourceMeter Instrument Reference Manual
MODEL 2657A HIGH POWER SOURCEMETER INSTRUMENT REFERENCE MANUAL User Manual2657A-901-01B Model 2651A High Power System SourceMeter Instrument User's Manual
User Manual用户 2651A-900-01A Model 2657A High Power System SourceMeter Instrument User's Manual
主要用户 2657A-900-01A
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技术文档 文档类型 发布日期 为新一代电力电子设计改进材料和测试
Transitioning from silicon to wide bandgap semiconductors such as silicon carbide and gallium nitride means that power module designs can be physically smaller than what came before, while also increasing MOSFET switching speed and energy efficiency …技术简介 四个关键测试：电源设计中验证MOSFET性能
If you need to evaluate MOSFET devices, download our poster to learn the test specification and technique, test configuration and the typical results for the four key MOSFET tests.Download the poster to learn about these four key tests:Drain Family …海报 高效完整的半导体功率器件特性分析，校对，稳定测试技术
速查资料 Touch, Test, Invent，采用下一代电流和电压源测量仪器
速查资料 简单精确地测试与表征功率半导体器件
应用指南 测试一个新的开关模块的电源设计海报
Get a quick overview of the key measurements for verifying a new switch mode power supply (SMPS) design. This poster shows key measurements, from verifying your prototype during initial startup, to optimizing switching loss and magnetic losses, to …海报 用2600B的信号源功能与2650A系列数字源表执行FORD EMC 功率循环测试
学习如何利用数字源表的高电流信号源功能进行功率循环测试。这篇应用文章描述了利用2600B的信号源功能与2650A系列数字源表执行FORD EMC-CS-2009.1 CI 230功率循环测试的详细程序。应用指南 功率转换效率测试的有效工具与技巧
速查资料 利用2461 高电流数字源表进行精确的高亮度LEDs脉冲测试
应用指南 当今汽车电子的电源测试应用手册
宣传册 当今汽车电子的电源测试
宣传册 使用吉时利 SMU 仪器和开关系统优化功率半导体器件和模块的可靠性测试
应用指南 汽车通讯与控制系统的测试方法
速查资料 半导体测量中的高速与输出
海报 高功率半导体器件的VDS Ramp与HTRB稳定性测试
应用指南 如何选择和应用源/测量仪器（源表）
应用指南 如何选择和应用源/测量仪器（源表）
应用指南 如何选择和应用源/测量仪器（源表）
应用指南 利用吉时利高功率系统数字源表 ® 源测量单元（SMU）仪器对功率 半导体器件进行测试
产品文章 2657A高功率源表规格书
Model 2657A High Power System SourceMeter Instrument Specifications Rev B技术指标 利用大功率数字源表构建多源测量单元（SMU）系统
应用指南 Harness the Power of TSP™ Toolkit Software
Introduction In an industry where rapid test development is crucial, the need for effective automation and easy code development has never been more pronounced. As businesses strive to enhance their quality while reducing time to market, the right …应用指南 MOSFET Testing System Flyer
Learn more about integrated measurement systems for comprehensive characterization of power MOSFETs and other devices. Keithley Parametric Curve Tracer (PCT) systems offer a complete solution for high voltage (± 3kV) C-V measurements. System …速查资料 Testing High Power Semiconductor Devices from Inception to Market
Introduction This primer examines the life cycle of a power semiconductor device and the tremendous variety of test and characterization activities and measurement challenges faced by the engineers involved in each stage throughout the cycle …入门指南 Challenges in GaN HEMT Power Device DC Characterization
GaN HEMT devices are very fast and efficient and have a unique structure and performance, but oscillation is one of the primary challenges with high frequency devices during the DC characterization. This application note discusses the oscillation …应用指南 Battery Cycling Test and Automation Considerations
This application note describes battery charge and discharge methods as well as applied pulsed current to better represent real world load scenarios. Example programs for automating battery cycling phases are also provided.应用指南 Boost Test Automation with On-Instrument Scripting - What is TSP?
Introduction Like many instrument operators, you may have a comfortable preference toward SCPI as the foundation for your instrument automation needs. If, however, you are looking for a means to reduce your test time and cost and are …应用指南 DC I-V Characterization of MOSFET Devices Using KickStart Software
Learn or review the details of some of the most common types of device transfer and characterization tests applied to metal oxide semiconductor field effect transistors (MOSFETs). This application note also presents itself as a graphic guide for how …应用指南 Model 2651A High Power System SourceMeter Instrument Specifications
Document number SPEC-2651AG Specifications are subject to change without notice. SPECIFICATION CONDITIONS This document contains specifications and supplemental information for the Model 2651A High Power System SourceMeter™ instrument …技术指标 New High Power Semiconductor Devices are Pushing Instrumentation to Extremes
Introduction The power electronics market, driven by new wide bandgap (WBG) semiconductor devices is expected to grow by a 4.3% compounded annual growth rate (CAGR) through 2025 to a level around $22B. Power transistors are expected …技术简介 Pulsed I-V Characterization of MOSFETs Using Keithley KickStart Software
Introduction Manufacturers of transistor devices tend to start their design prototype evaluations to yield characteristic information, while still working in their research and design labs. While straight DC testing is …应用指南 Pulsed Characterization of HBLEDs Using Keithley KickStart Software
This application note discusses the reasons why pulse-based testing might be beneficial for a semiconductor device and details the application of pulsed test for high-brightness LEDs. Specifics are provided for using Keithley KickStart Software to …应用指南 Source Measure Unit (SMU) Instruments Selector Guide
MAKE MULTIPLE MEASUREMENTS ACCURATELY USING A SINGLE INSTRUMENT A source measure unit (SMU) instrument is a five-in-one tool. It combines the useful features of a digital multimeter (DMM), power supply, current …产品选择指南 How to Transition Code to TSP from SCPI
Introduction For many years, instrument manufacturers have used "Standard Commands for Programmable Instrumentation" (SCPI) to control programmable test and measurement devices in test systems. The goal of SCPI is to provide a uniform and …应用指南 How to Write Scripts for Test Script Processing (TSP)
Introduction This application note introduces scripting with Keithley's Test Script Processor (TSP) technology and its most powerful and enticing features. With scripting, programs and code can be loaded directly onto an instrument and run locally …应用指南 Source Measure Units - Save Time, Space and Money and Make Multiple Measurements Accurately Using a Single Instrument
Make Multiple Measurements Accurately Using a Single Instrument All While Saving Space, Time and Money Do you use a power supply or digital multimeter? How about an electronic load …宣传册 Achieving Fast Pulse Measurements for Today's High Power Devices - Application Brief
应用指南 Understanding Control Systems and Communications for Today's Automobiles
速查资料 Maximize Speed and Throughput for Semiconductor Measurements Using Source Measure Units (SMUs)
海报 E-Handbook to Understanding Electrical Test and Measurement
Introduction Welcome to Keithley's Guide to Understanding Electrical Test and Measurement. For over 60 years, Keithley testand measurement instruments have provided measurements ranging from the most basic to very complex. In all …速查资料 E-Guide: Re-Inventing High Power Semiconductor and Device Characterization
速查资料 Power Device Testing Solutions for Design Validation, Characterization, and Reliability
速查资料 New Materials and Devices E-Guide
宣传册 Choosing the Optimal Source Measurement Unit Instrument for Your Test and Measurement Application (also Applicable to Series 2600B)
白皮书 End-to-End Power Test and Measurement Solutions
速查资料 Low Current/ High Resistance Measurement Selector Guide
Low Current/ High Resistance Measurement Selector Guide - 2013 Catalog产品选择指南 New Breed of Semiconductors Demands New Breed of Semi Characterization and Test Solutions
技术文章 Demand for Higher Power Semi Devices Will Require Pushing Instrumentation to New Extremes
技术文章 The Next Big LED Testing Challenge: High Power LED Modules
白皮书 Source Meters Selection Guide
产品选择指南 Source Measurement Unit (SMU) Instruments Simplify Characterizing a Linear Voltage Regulator's DC Performance
技术文章 Minimizing Cable-Induced Measurement Errors in High Current Applications
技术文章 Rapidly Expanding Array of Test Applications Continues to Drive Source Measurement Unit Instrument Technology (also Applicable to Series 2600B)
白皮书 KeithleyCare Plans - Cut Cost; Reduce Downtime; Protect Your Investment
宣传册 Accurate, Cost-Effective High Brightness LED Testing Starts with Device Fundamentals
High brightness light emitting diodes (HBLEDs) combine high output and high efficiency with long lifetimes. Manufacturers are developing devices that offer higher luminous flux, longer lifetimes, greater chromaticity, and …技术文章 Testing to 100A by Combining Keithley Model 2651A High Power SourceMeter Instruments (Application Note)
Introduction Source-measure units (SMUs), such as the Keithley Model 2651A High Power System SourceMeter instrument, are the most flexible and most precise equipment for sourcing and measuring current and voltage. Because of …应用指南 Testing to 100A by Combining Keithley Model 2651A High Power SourceMeter Instruments (Application Brief)
应用指南 Breakthrough Capabilities and Unmatched Performance for Characterizing and Testing High Power, High Current Electronics
速查资料 Measuring Pulsed Waveforms with the High Speed Analog-to-Digital Converter in the Model 2651A High Power System SourceMeter Instrument
应用指南
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软件 文档类型 部件号： 发布日期 KickStart Instrument Control Software version 2.11.2
KickStart Software for the PC enables quick test setup and data visualization when using one or more instruments. Key Features • Save time by automating data collection of millions of readings. • Set up a multi-instrument test with the ability to …应用 KICKSTART-2.11.2 KickStart Instrument Control Software version 2.11.1
KickStart Software for the PC enables quick test setup and data visualization when using one or more instruments. Key Features • Save time by automating data collection of millions of readings. • Set up a multi-instrument test with the ability to …应用 KICKSTART-2.11.1 Keithley I/O Layer version C10 (Windows 11, 10, 8, 7 Compatible)
Keithley I/O Layer version C10 (KIOL-850C10 adds support for Windows 10 and 11 Operating Systems and installs NI-VISA Runtime 17.5 and NI-ICP 17.0. This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL …应用 KIOL-850C10 Series 2650A Firmware and Release Notes - V1.2.0
Series 2650A Firmware v1.2.0 and Release NotesChanges in this release:The embedded web applications (Reading Buffers, Flash Upgrade, TSB Embedded) which relied on an outdated and unsupported version of Java have been re-implemented using modern web …固件 2650A-850SV1.2.0 Kickstart 仪器控制软件 2.5.0（Windows 10 8 7兼容）
"KickStart Software for the PC enables quick test setup and data visualization when using one or more instruments. Key Features • Save time by automating data collection of millions of …应用 IVI-COM Driver for Series 2600A/2600B System SourceMeters (KE26XXA IVI-COM Driver v1.9.0.0)
New Ke26XXA IVI Driver version 1.9.0.0 for 2600A/2600B Series Models (added support for new model 2601B-PULSE).驱动程序 2600A-IVI-1.9.0 Matlab_Hello world使用Matlab对仪器设备进行编程入门
本例程提供了Matlab对仪器进行控制，演示了最基本的连接仪器的步骤。 请注意相关软件配置环境以及VISA resource地址。Tektronix公司不负责该例程的完整性、可执行性和正确性。 请点击‘’安装说明“链接直接获取 TXT 源码文件脚本例程 Keithley Sequence Tools Library
This is a TSP script that installs support for list sweeps with an arbitrary mix of voltage and current steps on Series 2600B and 2650A SMU instruments.应用 2600B-SEQUENCE-V1.00 Series 2650A Firmware and Release Notes - V1.1.8
This zip file contains version 1.1.8 of Series 2650A firmware and release notes.固件 2650A-FRP-V1.1.8 IVI-COM Driver for Series 2600A/2600B System SourceMeters (KE26XXA IVI-COM Driver v1.8.0.0)
New Ke26XXA IVI Driver version 1.8.0.0 for 2600A/2600B Series Models (added support for new model 2606B).驱动程序 2600A-IVI-1.8.0 Series 2650A Firmware and Release Notes - V1.1.6
This zip file contains version 1.1.6 of Series 2650A firmware and release notes.固件 2650A-FRP-V1.1.6 Keithley I/O Layer - version C07 (Windows 8, 7, Vista, and XP Compatible)
Keithley I/O Layer version C07 (KIOL-850C07 adds a change to only send the :syst:rem command to RS-232 connections This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL-850C05, KIOL-850C06). This version …应用 KIOL-850C07 2651A Firmware Version 1.01 and Release Notes
Firmware and release notes version 1.01 for the 2651A固件 2650A-850SV1.0.1 Keithley Series 2600/2600A/2600B Native LabVIEW 2009 Instrument Driver version 2.5.0
Native LabVIEW Driver for 2600, 2600A, 2600B Series v2.5.0 (LabView 2009 or higher) (updated for new 2600B series models)驱动程序 2600-LV-2.5.0 IVI-COM Driver for Series 2600A/2600B System SourceMeters (KE26XXA IVI-COM Driver v1.4.5.0)
New Ke26XXA IVI Driver version 1.4.5.0 for 2600A/2600B Series Models(added support for new 2600B series models).驱动程序 2600A-IVI-1.4.5
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常见问题 常见问题 ID 2600SourceMeter SMU 仪器，使用网线连接，无法找到仪器时，该如何操作
打开NI max (到NI网站一下载NI visa安装，也可以用其他的客户端工具) 点击添加网络设备 选择自动发现设备，点下一步 Navigate to the latest instrument discovery log file. Go to My Documents - Keithley Instruments - KickStart - Log. Open the most recent file and at the top of the file, you …473226 吉时利2600SourceMeter SMU 仪器：内嵌式TSP Express软件使用说明
在我们2600系列的源表中内嵌有一款免费软件叫做TSP Express可以做I-V测试用。用网线把源表和电脑直连即可使用此软件。 以下，我就以2602双通道源表测试一个三极管举例软件使用方法。 所用试验设备：2602双通道源表一台、PC、网线、三极管NPN型S9013、面包板裸线若干。 硬件连接图如下： （注意：仪器背面板上有3个类似于网口的口，其中，左面那个如图，我连着蓝色网线的口才是网络口LAN口，右边两个类似于网络口的TSP …473406 为何吉时利源表无法加载设定的电压?
当2线接入被测件，回测电压始终小于设定的加载电压 需要确认接入测量端的阻抗和仪器的阻抗，确定输出所需的功率（仪器可能无法达到被测件需要加载的电压值）；建议使用4线制加载电压（跟踪输出）。473411 Can two Model 2657A be placed in parallel to gain higher current?
The 2657A can be connected in parallel with another 2657A to double the current available. Please make sure that the LO is tied to ground when you are connecting the 2657A in parallel to double the current available. You will need to use the …729096 Can two Model 2651A be connected in parallel or series?
A Keithley Model 2651A SourceMeter® Instrument can be connected in both series and parallel with another (and only one other) instrument of the same model number for higher voltages and currents as long as certain important conditions are observed …783013
