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产品技术资料 文献编号： 发布日期 4200A-SCS参数分析仪技术资料
亲眼见证创新！4200A-SCS是一种可以量身定制、全面集成 的参数分析仪，可以同步查看电流电压 (I-V)、电容电压 (C-V) 和超快速脉冲式I-V特性。作为性能最高的参数分析仪， 4200A-SCS 加快了半导体、材料和工艺开发速度1KC-60780-6
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技术文档 文档类型 发布日期 在高测试连接电容情况下使用 4201-SMU和 4211-SMU
应用指南 使用4200A-CVIV开关的偏置能力进行三端器件高达400 V电压的电容测试
应用指南 有机FET的 DC I-V和AC 阻抗测试
本技术指南概括介绍怎样使用4200A-SCS参数分析仪优化OFET的DC I-V和AC阻抗测量。讨论定时参数、降噪、屏蔽、正确布线及实现最佳效果的其他重要测量考虑因素。应用指南 使用4215-CVU测量 fF (1e-15F) 电容
应用指南 使用4200A-CVIV多开关和4200A-SCS参数分析仪在C-V测量和I-V测量之间切换 - NEW
应用指南 使用4200A-SCS参数分析仪进行范德堡和霍尔电压测量 - NEW
应用指南 使用吉时利Model 4200-SCS参数分析仪进行晶圆级可靠性测试
应用指南 Using the 4200A-CVIV Multi-Switch to Make High Voltage and High Current C-V Measurements
This application note explains the implementation of the bias tee modes of the 4200A-CVIV to make high voltage C-V measurement. It assumes the reader is familiar with making C-V measurements with the Keithley 4200A-SCS using the CVIV.应用指南 1 ns Pulsing Solutions for Non-Volatile Memory Testing
Until recently, floating gate (FG) NAND flash memory technology has been successful in meeting the demand for non-volatile memory (NVM) devices for tablets and smartphones. However, there is increasing concern in the …技术简介 Making Low Current Pulse I-V Measurements
This application note defines ultra-fast I-V, explains the fundamental limits of current measurements as a function of time and measure window, and describes the techniques for making ultra-fast I-V low current measurements.应用指南 Making Stable Low Current Measurements with High Test Connection Capacitance Using the 4201-SMU and 4211-SMU
Introduction The source measure unit (SMU) is an instrument that can source current or voltage, and measure both current and voltage. The SMU is used for I-V characterization of a wide variety of devices and materials, and is designed …应用指南 Measuring MOSFET Gate Charge with the 4200A-SCS Parameter Analyzer
Introduction Power MOSFETs are used in a variety of applications and can be used as high-speed switching. The switching speed of the device is affected by internal capacitances, which is typically specified in data sheets in terms of Ciss and Coss …应用指南 Making Optimal Capacitance and AC Impedance Measurements with the 4200A-SCS Parameter Analyzer
Introduction Capacitance-voltage (C-V) and AC impedance measurements are commonly performed on many types of devices for a wide variety of applications. For example, C-V measurements are used to determine these device parameters: Gate oxide …应用指南
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软件 文档类型 部件号： 发布日期 4200A-SCS Clarius+ Software Suite V1.13
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer. If installing on a …应用 4200A-CLARIUS-V1.13 4200A-SCS Clarius+ Software Suite V1.12
This version of Clarius+ is only supported on Microsoft Windows 10. If installed on the 4200A-SCS system with a Clarius+ release prior to V1.4, contact Keithley, a Tektronix company, at tek.com to upgrade the parameter analyzer If installing on a …应用 4200A-CLARIUS-V1.12 4200A-SCS Clarius+ Software Suite V1.3 (Legacy – Unsupported)
This legacy version of Clarius is made available for Windows 7 computers. For the latest version of Clarius+ please visit the 4200A-SCS Product Support page ( Product Support and Downloads | Tektronix ) and select Software. The 4200A-SCS Clarius+ …应用 4200A-CLARIUS-V1.3
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常见问题 常见问题 ID How can I measure hall mobility of 2D materials?
Hall mobility, or electron mobility, of a 2D material is best measured by utilizing the Hall effect. There are several different Keithley solutions for making Hall effect measurements. A Keithley 4200A-SCS Parameter Analyzer with 4 Source Measure …71221