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产品技术资料 文献编号： 发布日期 237-AGL-2型三轴电缆产品技术资料
The Keithley Instruments Model 237-ALG-2 is a 6.6 ft (2 m) triaxial cable that is terminated with a three-slot male triaxial connector on one end and alligator clips on the other end.PA-298D 6220 6221直流电流源交流和直流电流源
6220直流电流源和6221交流/直流电流源是非常易于使用的超低电流噪声电流 源。低电流的产生在从许多研发到生产，尤其是在半导体、纳米技术和超导行业方 面的测试环境应用非常重要。高准确度的源和内建控制功能使6220和6221成为霍尔 测量、使用delta模式的电阻测量、脉冲测量和微分电导测量等应用的理想选择。Model 4288-2 Dual-Unit Rack-Mount Kit
The Model 4288-2 Dual Fixed Rack Mounting Kit includes all of the hardware necessary for side-by-side rack mounting of two instruments, including Series 2000, 2182A, Series 2300, Series 2500, 2700, 2701, 6220, 6221, 6485, 6487, 6514, or 6517B.PA-290D
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手册 手册类型 部件号： 发布日期 Keithley Instruments Safety Precautions
Safety Precautions PA用户 071341102 Model 6220 DC Current Source Model 6221 AC and DC Current Source User's Manual
主要用户 622X-900-01C Model 6220 DC Current Source Model 6221 AC and DC Current Source Reference Manual
用户 622X-901-01C
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技术文档 文档类型 发布日期 霍尔效应测试系统（中文6页）
技术文章 Applications Guide - Techniques for Multi-Channel Testing and Data Acquisition
速查资料 纳米技术电气测量最新技术电子手册
Rev 3.13速查资料 Advances in Electrical Measurements for Nanotechnology E-Handbook (Chinese verison)
宣传册 寻找当今解决方案，迎接未来纳米特性分析挑战
宣传册 利用不同传导测试方法进行纳米材料的特性分析（英文3页）
技术文章 Supporting the Materials Research of the Future
Advances in materials science are driving the future of many industries where the electrical properties of materials can reveal previously unknown materials characteristics. This flyer highlights the Keithley instrumentation that is vital to helping …速查资料 Four Step Error Checker Poster
This printable poster offers insight into errors commonly made when measuring low voltage, low current, low resistance, high resistance, or voltage from a high resistance source. Learn what can cause these errors, and get tips on how to avoid them.海报 Keithley Low Level Measurements Handbook - 7th Edition
The Keithley Low Level Measurements Handbook is a reference and guide for anyone looking to perform sensitive DC electrical measurements. Scroll down to find the section you need, or download the entire book as a PDF above. Once you click on each of …产品文章 SOLUTIONS FOR SCIENTIFIC AND ENGINEERING RESEARCH
宣传册 E-Handbook to Understanding Electrical Test and Measurement
Introduction Welcome to Keithley's Guide to Understanding Electrical Test and Measurement. For over 60 years, Keithley testand measurement instruments have provided measurements ranging from the most basic to very complex. In all …速查资料 New Materials and Devices E-Guide
宣传册 Making Precision Low Voltage and Low Resistance Measurements E-Handbook
速查资料 Optimizing Low-Current Measurements and Instruments
Characterizing devices at low current levels requires knowledge, skill, and the right test equipment. Even with all three, achieving accuracy at low current levels can be a challenge because the level of the current is often at or below the noise …白皮书 Advances in Electrical Measurements for Nanotechnology
Rev 3.15.13产品文章 High Impedance Semiconductor Resistivity and Hall Effect Test Configurations
宣传册 Low Current/ High Resistance Measurement Selector Guide
Low Current/ High Resistance Measurement Selector Guide - 2013 Catalog产品选择指南 Low Voltage/ Low Resistance Measurements
产品选择指南 MODEL 6221 AC AND DC CURRENT SOURCE INSTRUMENT SPECIFICATION
MODEL 6221 AC AND DC CURRENT SOURCE INSTRUMENT SPECIFICATION REV C技术指标 Hall Effect Measurements in Materials Characterization
Hall effect measurements have been valuable tools for material characterization since Edwin Hall discovered the phenomenon in 1879. Essentially, the Hall effect can be observed when the combination of a magnetic field …白皮书 Guide to Measuring New Materials and Devices
产品文章 Pulse Testing for Nanoscale Devices
技术文章 New dG Measurement Methods Reveal Nanodevice Characteristics Faster, at Lower Cost
技术文章 AC Versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices
AC versus DC Measurement Methods for Low-power Nanotech and Other Sensitive Devices Sensitive Measurement Needs Researchers today must measure mate-rial and device characteristics that involve very small currents and voltages. …技术文章 The Emerging Challenges of Nanotechnology Testing
Nanotechnology is an important new area of research that promises significant advances in electronics, materials, biotechnology, alternative energy sources, and dozens of other applications. …技术文章 #2615 Determining Resistivity and Conductivity Type using a Four-Point Collinear Probe and the Model 6221 Current Source
应用指南 New Instruments Can Lock Out Lock-ins
白皮书 Low-Voltage Measurement Techniques
Introduction Electronics are continuing to shrink as consumers demand faster, more feature-rich products in ever-smaller form factors. Because of their small sizes, these electronic components usually have limited power handling …技术文章 Electrical Measurements on Nanoscale Materials
This tutorial explains the importance of electrical measurements to the science of nanotechnology, and presents practical considerations in making these measurements. Topics include material and structural characteristics that can be …技术文章 #2611 Low-Level Pulsed Electrical Characterization with the Model 6221/2182A Combination
应用指南 An Improved Method for Differential Conductance Measurements
Introduction As modern electronics continue to shrink, researchers are increasingly looking to nano technology as the basis for the next breakthrough in device size and power consumption. Indeed, as semiconductor structures …白皮书 Models 6220 Current Source Specifications Rev. B
Model 6220 Programmable Current Source Specifications Rev. B技术指标 Precision, Low Current Sources for Device Testing and Characterization
High accuracy, low noise sourcing combined with exceptional ease of use Keithley's new Model 6220 DC Current Source and Model 6221 AC and DC Current Source deliver the high resolution, low noise, low current sourcing you need …宣传册 Unraveling Fuel Cell Electrical Measurements
技术文章 Problem: Reading Drift in Low Resistance Measurements
技术文章 Problem: Noisy Readings in Low Resistance Measurements
技术文章 Problem: Noisy Readings in High Resistance Measurements
技术文章 Problem: Errors in Low Resistance Measurements
技术文章 Problem: Error in Low Voltage, Low Current Measurements
技术文章 Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications
白皮书
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软件 文档类型 部件号： 发布日期 6220/6221 FIRMWARE RELEASE E02
Model 6220/6221 E02 Firmware Release Use with Keithley Flash Wizard to upgrade a 6220/6221 instrument. DO NOT install revision E firmware on instruments with revision A or D firmware.固件 6221-FRP-E02 Keithley I/O Layer version C10 (Windows 11, 10, 8, 7 Compatible)
Keithley I/O Layer version C10 (KIOL-850C10 adds support for Windows 10 and 11 Operating Systems and installs NI-VISA Runtime 17.5 and NI-ICP 17.0. This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL …应用 KIOL-850C10 6220/6221 Firmware Revision D04
Model 6220/6221 D04 Firmware Release.DO NOT install revision D firmware on instruments with revision A firmware.固件 6221-801D04 Matlab_Hello world使用Matlab对仪器设备进行编程入门
本例程提供了Matlab对仪器进行控制，演示了最基本的连接仪器的步骤。 请注意相关软件配置环境以及VISA resource地址。Tektronix公司不负责该例程的完整性、可执行性和正确性。 请点击‘’安装说明“链接直接获取 TXT 源码文件脚本例程 Keithley I/O Layer - version C07 (Windows 8, 7, Vista, and XP Compatible)
Keithley I/O Layer version C07 (KIOL-850C07 adds a change to only send the :syst:rem command to RS-232 connections This release replaces previous versions of KIOL-850B07, KIOL-850C02, KIOL-850C03, KIOL-850C04, KIOL-850C05, KIOL-850C06). This version …应用 KIOL-850C07 6220/6221 Firmware Revision D03
6220/6221 D03 Firmware Installation Package (READ RELEASE NOTES FIRST)固件 6221-801D03 Install v2.7 of the Free Example Software for the Models 6220/6221. (UNSUPPORTED)
Install v2.7 of the Free Example Software for the Models 6220/6221.应用 6220-EXMPL-2.7 6220/6221 IVI Driver for Visual Basic (VB), VC/C++, Labview (LV) and LabWindows CVI, Rev. B01.1 (6.4Mb) - Requires Installation of Keithley I/O Layer (KIOL-850)
6220/1 IVI Driver Rev. B01.1驱动程序 622X-855B011 6220/6221 Firmware Revision A05
6220/6221 A05 Firmware Installation Package固件 6221-801A05 622x Native LabView 2009 Driver version 1.0.0 - Project Style
6220 & 6221 Native LabView 2009 Driver version 1.0.0 - project style.驱动程序 622X-LV-1.0.0 6220/6221 Firmware revision A04
6220/6221 Firmware revision A04固件 6221-801A04
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常见问题 常见问题 ID How can I measure hall mobility of 2D materials?
Hall mobility, or electron mobility, of a 2D material is best measured by utilizing the Hall effect. There are several different Keithley solutions for making Hall effect measurements. A Keithley 4200A-SCS Parameter Analyzer with 4 Source Measure …71221 How to configure the Model 6220/6221 and 2182A for Delta Mode?
The Keithley Models 6220 and 6221 Current Sources are designed to work with the Model 2182A Nanovoltmeter to measure very low resistances. A good method of doing this is called the Delta Method as described in the Keithley Low Level Measurements …783018
