TDSRT-Eye™ v2.0

Features & Benefits

• MyTest Provides Measurement Results with a Touch of a Button
• Serial Data Wizard for Easy Setup
• Real-time Acquisition and Analysis on Electrical Standards Beyond 10.25 Gb/s (DPO72004)
• Patented Real-time Eye (RT-Eye) Clock Recovery and Eye Rendering Provides:
• High-precision Eye Diagrams and Accurate Jitter Measurements
• Standard Specific Clock Recovery
• Transition/Nontransition Bit Eye Diagram and De-emphasis Measurements
• Accumulated Waveform Database Eye Diagrams
• Patented Software PLL-based Clock and Data Recovery Accurately Models System Performance
• SmartGating Feature for Flexible Clock Recovery and Measurement Windowing
• Amplitude, Timing, and Jitter Measurements (including RJ, DJ, and Total Jitter at 10^-12 BER on Repetitive and Arbitrary Patterns)
• Bit Error Locator Highlights Mask Failures on the Real-time Waveform
• Automated Pass/Fail Waveform Mask and Measurement Limit Testing
• Multiple Graticule Plotting Windows for Simultaneous Eye-diagram, Histogram, Spectrum, and Bathtub-curve Analysis
• Compliance Analysis Modules (Optional) Provide Plug-fest Level Tests
• Available: PCI Express (Opt. PCE), InfiniBand (Opt. IBA); SATA and SAS Analysis module (Opt. SST), FB-DIMM (Opt. FBD)
• Other Standards: Under Development
• Custom and Standard Specific Report Generation

Applications

Analog Validation and Compliance Testing of Emerging Serial Data Standards Including:

• PCI Express
• FB-DIMM
• InfiniBand
• Serial ATA
• Serial Attached SCSI (SAS)
• Fibre Channel
• 10 GbE XAUI
• 10 GbFC XAUI
• IEEE 1394b
• RapidIO

Accurate, Simple, and Customizable Physical Layer Testing on Emerging Serial Data Standards Beyond 10 Gb/s

When designing to industry standards, analog validation and compliance testing is critical to ensure device interoperability. TDSRT-Eye v2.0 Serial Data Compliance and Analysis software (Opt. RTE), used with the DPO70000, TDS/CSA7000/B, and TDS6000/B/C Series of high-performance oscilloscopes and proper probing solutions, provides the complete solution for analog validation and compliance testing of serial data buses.

RT-Eye v2.0 Clock Recovery and Eye Rendering

The first step in creating an eye diagram and performing accurate jitter measurements on data is recovering the clock from the serial bit stream. The RT-Eye eye rendering technique provides user-selectable algorithms (PLL or Constant Clock) to recover the clock. This technique provides the following benefits:

High-precision Eye Diagrams - Since the waveform is captured from a single trigger event, and the clock is recovered through software, this method provides a much lower jitter noise floor (JNF) than most equivalent-time (ET) hardware-based clock recovery techniques.

Standard Specific Clock Recovery - Patented PLL-based clock recovery is most common in many data communications standards. However, some standards such as PCI Express require supporting many receiver clock recovery topologies such as phase interpolation and oversampling. Software-based clock recovery allows you to select the clock recovery method that best suits your device. Further, use of the SmartGating feature allows the user to define a clock recovery window within the acquisition as well as an additional analysis window that defines where in the recovery window the measurements will be made.

Transition/Nontransition Bit Separation and De-emphasis Measurements - The real-time capture provides the ability to differentiate between transition bits and trailing bits for mask testing and measurements useful in systems employing de-emphasis (form of active equalization also known as pre-emphasis or equalization). Amplitude measurements can be made separately on the emphasized bits and the non-emphasized bits, allowing a de-emphasis measurement ratio to be displayed.

Accumulated Waveform Database Eye Diagrams - The accumulated waveform database provides a three-dimensional eye-diagram plot. If the software is put in Free Run mode, the eye diagram is accumulated over time much like traditionally equivalent time displays.

Waveform Eye Diagrams and Jitter Measurements are Inseparable

In the past, waveform mask testing and jitter measurements have been performed with at least two, and sometimes three pieces of instrumentation. Waveform eye diagrams were viewed with sequential equivalent time-sampling oscilloscopes or real-time oscilloscopes operating in an equivalent-time mode. BERT and/or time interval analyzers were required to make total jitter measurements. The TDSRT-Eye v2.0 software uses patented techniques to separate jitter components (RJ, DJ, and TJ at 10^-12 BER) in serial data bit streams captured with a real-time oscilloscope, whether the signal has a repeating pattern or if it is arbitrary. This technique is recognized by the T11.2 MJSQ as an alternative to using other specialized equipment. More recently, some standards in the computer industry, such as PCI Express and Serial ATA, require that jitter measurements be performed on a specified number of consecutive (contiguous) bits, a requirement only satisfied by real-time oscilloscope technology. Whichever jitter measurement method is required, TDSRT-Eye v2.0 software performs eye diagrams and various industry-specified jitter measurements from a single real-time waveform acquisition. Additional confidence can be gained by accumulating statistics over multiple acquisitions. This allows you to use a single high-performance real-time oscilloscope for design, debug, validation, and compliance of your serial data components.

Simple Parametric Limits Modules

Mask testing and jitter measurements performed with TDSRT-Eye v2.0 software can be turned into a custom compliance test by defining a Limits File and a User Mask file. A Limits File allows you to select which measurements you want to perform Pass/Fail compliance testing on. Test limits on masks and measurements can be edited and saved into User Mask and Limits Files.

Standard-specific Compliance and Analysis Modules

TDSRT-Eye v2.0 software can also be configured with optional compliance and analysis modules. The modules provide specific Pass/Fail waveform mask and measurement limit testing in conformance with industry-hosted plug fests and workshops. Compliance and analysis modules currently available include:

PCI Express Compliance Module - The PCI Express compliance module (Opt. PCE), when ordered with TDSRT-Eye v2.0 software, provides the complete solution for electrical compliance tests. Module includes physical layer measurements defined at the Driver, Add-in Card, System, Receiver, and Reference Clock test points as defined in Revision 1.0a and 1.1 of the PCI Express specifications (Base Specification and Card Electrical Mechanical (CEM) Specifications). The Use SigTest feature allows for the import and automated setup for using the SigTest software provided by the PCI-SIG. Preliminary testing for Gen2 (5.0 Gb/s) is also provided.

FB-DIMM Compliance Module - The FB-DIMM (Fully Buffered - Dual Inline Memory Module) compliance module (Opt. FBD), when ordered with TDSRT-Eye v2.0 software, provides the complete solutions for electrical compliance tests. Module includes physical layer measurements defined in the JEDEC High-speed PTP (Point-to-Point) Link specification.

SATA and SAS Analysis Module - The SATA and SAS analysis module (Opt. SST), when ordered with TDSRT-Eye, provides the test solution to conduct electrical tests. Module includes physical measurements specified in SATA Working Group and T10 (SAS) committee.

InfiniBand Compliance Module - The InfiniBand compliance module (Opt. IBA), when ordered with TDSRT-Eye v2.0 software, provides the complete solution for electrical compliance tests. The module includes physical layer measurements called out in Chapter 6 of version 1.1 of the InfiniBand architecture specification.

Custom and Standard Specific Report Generation

Whether you're documenting results in the validation stage of your design or archiving compliance reports for future reference, the TDSRT-Eye v2.0 software provides both standard compliance report templates and a Report Generator that allows you to customize your test reports.