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应用指南

How to Perform DC Current Gain Testing on Bipolar Junction Transistors with a Two …

Read how the KickStart Software IV Characterizer App provides a simple, reliable way to measure BJT DC current gain (hFE …
白皮书

面向数据中心应用的高效电源测试

现代数据中心面临着前所未有的功率与能效挑战。这些需求由人工智能、高性能计算和超大规模架构驱动。相关应用在每台机架中集成了更多处理器,将总功率密度和冷却要求推向了新的高度。泰克测试解决方案旨在直面这些挑战。泰克旗下的EA Elektro …
Resource Type
Blog

Measuring Current using Shunt Resistors

There are different techniques for measuring the current flowing in a circuit. Employing Ohm’s law by inserting a shunt …
Blog

How to Measure Current with an Oscilloscope

Though it’s not uncommon to measure current with a digital multimeter, measuring current that changes over time requires …
应用指南

如何选择和应用源/测量仪器(源表)

源测量单元(SMU)仪器正越来越流行,因为越来越多的人发现,其紧密集成的数字万用表(DMM)和精密电源功能可以为整个电子行业和半导体行业中的各种应用服务。本电子指南介绍了怎样审慎地评估仪器指标,以便为特定应用选择适合的SMU仪器。
应用指南

远程控制和访问 2 系 MSO 混合信号示波器

在过去几年中,远程教学、居家办公和混合办公环境已经成为许多教育机构和企业的新标准。这种新的远程办公文化带来了多个挑战,比如需要远程控制仪器,与同事分享仪器屏幕,与团队其他成员分享仪器上采集的数据,或者没有仪器时在电脑上分析采集的数据。泰克 …
应用指南

Synchronizing Parallel Testing with the MP5000 Series

This application note demonstrates how to use the MP5000 Series Modular Precision Test System to synchronize six …
Blog

New De-embedding, Embedding, and Equalization Software for High-Speed Systems …

Verification and compliance of high-speed systems require visibility across the full signal path—from DUT to …
应用指南

如何选择和应用源/测量仪器(源表)

源测量单元(SMU)仪器正越来越流行,因为越来越多的人发现,其紧密集成的数字万用表(DMM)和精密电源功能可以为整个电子行业和半导体行业中的各种应用服务。本电子指南介绍了怎样审慎地评估仪器指标,以便为特定应用选择适合的SMU仪器。
Webinar

Migrating from Silicon to Silicon Carbide in Power Designs

Ready to make the switch from Silicon to Silicon Carbide? Join experts from Tektronix, Wolfspeed, and PE Systems for a 3 …
Webinar

Migrating from Silicon to Silicon Carbide in Power Designs

Ready to make the switch from Silicon to Silicon Carbide? Join experts from Tektronix, Wolfspeed, and PE Systems for a 3 …
Webinar

Migrating from Silicon to Silicon Carbide in Power Designs

Ready to make the switch from Silicon to Silicon Carbide? Join experts from Tektronix, Wolfspeed, and PE Systems for a 3 …
应用指南

Accelerate Automation: Effortless Script Generation with TSP Toolkit

Adopting a new instrument or command set can be daunting and pose a unique set of challenges. Engineers, researchers …
应用指南

Simplifying Long-Term Reliability Testing with the KickStart Data Logger App

This application note shows how to easily automate long term data acquisition and analysis with the KickStart Data …
Product Demo

De-Embedding PCB Cable and Fixture Effects for Accurate Eye Diagram Measurements with …

This video demonstrates how you can easily de‑embed cables, connectors, and PCB traces, add virtual test points, and …
Resource Type
Resource Type
Resource Type
Blog

Understanding ENOB (Effective Number of Bits) in Test and Measurement Equipment

ENOB — the Practical Measure of ADC Accuracy Leading-edge electronic systems are becoming faster, denser, and more …

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